A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting
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Abstract
We propose a combined line segment and elliptical arc detec- tor, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse fitting tech- nique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated im- ages and on natural images.
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